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Information card for entry 4133685
Preview
Coordinates | 4133685.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H74 N2 Si6 |
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Calculated formula | C32 H74 N2 Si6 |
SMILES | [Si]([Si](C)(C)C)([Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C(C)(C)C)(C(C)(C)C)C(C)(C)C)=C1N(C(=C(N1C(C)C)C)C)C(C)C |
Title of publication | Disilene-Silylene Interconversion: A Synthetically Accessible Acyclic Bis(silyl)silylene. |
Authors of publication | Reiter, Dominik; Holzner, Richard; Porzelt, Amelie; Altmann, Philipp J.; Frisch, Philipp; Inoue, Shigeyoshi |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
Journal volume | 141 |
Journal issue | 34 |
Pages of publication | 13536 - 13546 |
a | 11.3385 ± 0.0004 Å |
b | 12.1541 ± 0.0004 Å |
c | 16.6351 ± 0.0006 Å |
α | 90.739 ± 0.002° |
β | 97.371 ± 0.002° |
γ | 116.989 ± 0.001° |
Cell volume | 2019.35 ± 0.12 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0393 |
Residual factor for significantly intense reflections | 0.0306 |
Weighted residual factors for significantly intense reflections | 0.0678 |
Weighted residual factors for all reflections included in the refinement | 0.0711 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4133685.html
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