Information card for entry 4133686

Structure parameters

• Formula: C26 H56 N2 O2 Si3
• Calculated formula: C26 H56 N2 O2 Si3
• SMILES: [Si](O[Si]([Si](C(C)(C)C)(C(C)(C)C)C(C)(C)C)(=O)=C1N(C(=C(N1C(C)C)C)C)C(C)C)(C)(C)C
• Title of publication: Disilene-Silylene Interconversion: A Synthetically Accessible Acyclic Bis(silyl)silylene.
• Authors of publication: Reiter, Dominik; Holzner, Richard; Porzelt, Amelie; Altmann, Philipp J.; Frisch, Philipp; Inoue, Shigeyoshi
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2019
• Journal volume: 141
• Journal issue: 34
• Pages of publication: 13536 - 13546
• a: 17.0644 ± 0.0009 Å
• b: 10.4534 ± 0.0006 Å
• c: 18.0274 ± 0.0009 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 3215.7 ± 0.3 ų
• Cell temperature: 100 K
• Ambient diffraction temperature: 100 K
• Number of distinct elements: 5
• Space group number: 33
• Hermann-Mauguin space group symbol: P n a 21
• Hall space group symbol: P 2c -2n
• Residual factor for all reflections: 0.0376
• Residual factor for significantly intense reflections: 0.0352
• Weighted residual factors for significantly intense reflections: 0.086
• Weighted residual factors for all reflections included in the refinement: 0.0877
• Goodness-of-fit parameter for all reflections included in the refinement: 1.085
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No