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Information card for entry 4134532
Preview
Coordinates | 4134532.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | In8 Ir2 Se |
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Calculated formula | In8 Ir2 Se |
Title of publication | The Subchalcogenides Ir<sub>2</sub>In<sub>8</sub>Q (Q = S, Se, Te): Dirac Semimetal Candidates with Re-entrant Structural Modulation. |
Authors of publication | Khoury, Jason F.; Rettie, Alexander J. E.; Robredo, Iñigo; Krogstad, Matthew J.; Malliakas, Christos D.; Bergara, Aitor; Vergniory, Maia G.; Osborn, Raymond; Rosenkranz, Stephan; Chung, Duck Young; Kanatzidis, Mercouri G. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2020 |
Journal volume | 142 |
Journal issue | 13 |
Pages of publication | 6312 - 6323 |
a | 9.92 ± 0.0006 Å |
b | 9.9262 ± 0.0006 Å |
c | 10.1092 ± 0.0006 Å |
α | 90° |
β | 90° |
γ | 89.9995° |
Cell volume | 995.43 ± 0.1 Å3 |
Cell temperature | 120 K |
Ambient diffraction temperature | 120 K |
Number of distinct elements | 3 |
Space group number | 6 |
Hermann-Mauguin space group symbol | P 1 1 m |
Hall space group symbol | P -2 |
Residual factor for all reflections | 0.0749 |
Residual factor for significantly intense reflections | 0.0513 |
Weighted residual factors for significantly intense reflections | 0.1085 |
Weighted residual factors for all reflections included in the refinement | 0.1101 |
Goodness-of-fit parameter for significantly intense reflections | 3.32 |
Goodness-of-fit parameter for all reflections included in the refinement | 2.45 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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