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Information card for entry 4307544
Preview
Coordinates | 4307544.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C76 H70 Ge6 O10 Ru4 |
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Calculated formula | C76 H70 Ge6 O10 Ru4 |
SMILES | C(#[O])[Ru]12345(C#[O])[Ge](c6ccccc6)(c6ccccc6)[Ru]6785(C#[O])(C#[O])[Ge]51(c1ccccc1)[Ru]198(C#[O])(C#[O])([Ge]26(c2ccccc2)[Ru]459(C#[O])(C#[O])([Ge]1(c1ccccc1)c1ccccc1)[Ge]3(c1ccccc1)c1ccccc1)[Ge]7(c1ccccc1)c1ccccc1.O(CC)CC.CCOCC |
Title of publication | Multiple Additions of Phenylgermanium Ligands to Tetraruthenium and Tetraosmium Carbonyl Cluster Complexes |
Authors of publication | Richard D. Adams; Erin M. Boswell; Burjor Captain; Mitul A. Patel |
Journal of publication | Inorganic Chemistry |
Year of publication | 2007 |
Journal volume | 46 |
Pages of publication | 533 - 540 |
a | 11.7557 ± 0.0007 Å |
b | 25.424 ± 0.0016 Å |
c | 24.7493 ± 0.0016 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 7397 ± 0.8 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 20 |
Hermann-Mauguin space group symbol | C 2 2 21 |
Hall space group symbol | C 2c 2 |
Residual factor for all reflections | 0.0298 |
Residual factor for significantly intense reflections | 0.0258 |
Weighted residual factors for significantly intense reflections | 0.0579 |
Weighted residual factors for all reflections included in the refinement | 0.0597 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4307544.html
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Users of the data should acknowledge the original authors of the
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