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Information card for entry 4307943
Preview
| Coordinates | 4307943.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 20 |
|---|---|
| Formula | C36 H42 O S5 Si W |
| Calculated formula | C36 H42 O S5 Si W |
| SMILES | [W]12(SC(=C(S2)C)C)(SC23CC4CC(CC(C4)C3)C2)(SC(=C(S1)C)C)O[Si](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Synthesis and Structures of Bis(dithiolene)tungsten(IV,VI) Thiolate and Selenolate Complexes: Approaches to the Active Sites of Molybdenum and Tungsten Formate Dehydrogenases |
| Authors of publication | Stanislav Groysman; R. H. Holm |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2007 |
| Journal volume | 46 |
| Pages of publication | 4090 - 4102 |
| a | 10.9448 ± 0.0016 Å |
| b | 12.9035 ± 0.0018 Å |
| c | 25.552 ± 0.004 Å |
| α | 90° |
| β | 91.022 ± 0.003° |
| γ | 90° |
| Cell volume | 3608 ± 0.9 Å3 |
| Cell temperature | 193 ± 2 K |
| Ambient diffraction temperature | 193 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0504 |
| Residual factor for significantly intense reflections | 0.0393 |
| Weighted residual factors for significantly intense reflections | 0.0937 |
| Weighted residual factors for all reflections included in the refinement | 0.0993 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4307943.html
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