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Information card for entry 4307944
Preview
| Coordinates | 4307944.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | (Et4N)2[21]*CH3CN |
|---|---|
| Formula | C26 H55 Mo N3 S5 |
| Calculated formula | C26 H55 Mo N3 S5 |
| SMILES | [Mo]12(SC(C)=C(S1)C)(SC(=C(S2)C)C)=S.[N+](CC)(CC)(CC)CC.[N+](CC)(CC)(CC)CC.C(#N)C |
| Title of publication | Synthesis and Structures of Bis(dithiolene)tungsten(IV,VI) Thiolate and Selenolate Complexes: Approaches to the Active Sites of Molybdenum and Tungsten Formate Dehydrogenases |
| Authors of publication | Stanislav Groysman; R. H. Holm |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2007 |
| Journal volume | 46 |
| Pages of publication | 4090 - 4102 |
| a | 13.2009 ± 0.0009 Å |
| b | 13.7465 ± 0.0009 Å |
| c | 19.2673 ± 0.0013 Å |
| α | 95.866 ± 0.001° |
| β | 94.09 ± 0.001° |
| γ | 90.356 ± 0.001° |
| Cell volume | 3468.9 ± 0.4 Å3 |
| Cell temperature | 193 ± 2 K |
| Ambient diffraction temperature | 193 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1568 |
| Residual factor for significantly intense reflections | 0.063 |
| Weighted residual factors for significantly intense reflections | 0.1163 |
| Weighted residual factors for all reflections included in the refinement | 0.1486 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.954 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4307944.html
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Users of the data should acknowledge the original authors of the
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