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Information card for entry 4308257
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Coordinates | 4308257.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [ReOCl(PhCONCSNPhMe)2] |
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Chemical name | Chlorooxobis(N-benzoyl-N'-phenyl-N'-methylthioureato-O,S)rhenium(V) |
Formula | C30 H26 Cl N4 O3 Re S2 |
Calculated formula | C30 H26 Cl N4 O3 Re S2 |
SMILES | [Re]12(Cl)(=O)([S]=C(N=C(O1)c1ccccc1)N(c1ccccc1)C)[S]=C(N=C(O2)c1ccccc1)N(C)c1ccccc1 |
Title of publication | Rhenium and Technetium Complexes with N,N-Dialkyl-N'-benzoylthioureas |
Authors of publication | Nguyen Hung Huy; Ulrich Abram |
Journal of publication | Inorganic Chemistry |
Year of publication | 2007 |
Journal volume | 46 |
Pages of publication | 5310 - 5319 |
a | 19.7272 ± 0.001 Å |
b | 18.8114 ± 0.001 Å |
c | 18.5113 ± 0.001 Å |
α | 90° |
β | 117.852 ± 0.01° |
γ | 90° |
Cell volume | 6073.7 ± 0.8 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1072 |
Residual factor for significantly intense reflections | 0.0489 |
Weighted residual factors for significantly intense reflections | 0.0975 |
Weighted residual factors for all reflections included in the refinement | 0.1263 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.946 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4308257.html
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