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Information card for entry 4308258
Preview
| Coordinates | 4308258.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | TcOCl(PhCONCSPh2)2 |
|---|---|
| Chemical name | chlorooxobis(N-benzoyl-N',N'-diphenylthioureato-O,S)technetium(V) |
| Formula | C40 H30 Cl N4 O3 S2 Tc |
| Calculated formula | C40 H30 Cl N4 O3 S2 Tc |
| SMILES | [Tc]12(=O)(Cl)(SC(=NC(=[O]1)c1ccccc1)N(c1ccccc1)c1ccccc1)SC(=NC(=[O]2)c1ccccc1)N(c1ccccc1)c1ccccc1 |
| Title of publication | Rhenium and Technetium Complexes with N,N-Dialkyl-N'-benzoylthioureas |
| Authors of publication | Nguyen Hung Huy; Ulrich Abram |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2007 |
| Journal volume | 46 |
| Pages of publication | 5310 - 5319 |
| a | 10.763 ± 0.001 Å |
| b | 11.207 ± 0.001 Å |
| c | 16.926 ± 0.001 Å |
| α | 92.48 ± 0.01° |
| β | 99.99 ± 0.01° |
| γ | 114.8 ± 0.01° |
| Cell volume | 1809.8 ± 0.3 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1387 |
| Residual factor for significantly intense reflections | 0.0639 |
| Weighted residual factors for significantly intense reflections | 0.1104 |
| Weighted residual factors for all reflections included in the refinement | 0.1474 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.929 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4308258.html
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Users of the data should acknowledge the original authors of the
structural data.