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Information card for entry 4308262
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Coordinates | 4308262.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Re2O3(PhCONCSCEt2)4 |
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Chemical name | mu-oxo{bis(N-benzoyl-N'N'-diethylthioureato)oxorhenium(V)} |
Formula | C48 H60 N8 O7 Re2 S4 |
Calculated formula | C48 H60 N8 O7 Re2 S4 |
SMILES | [Re]12(=O)(O[Re]34(=O)([S]=C(N=C(O3)c3ccccc3)N(CC)CC)[S]=C(N=C(O4)c3ccccc3)N(CC)CC)([S]=C(N=C(O1)c1ccccc1)N(CC)CC)[S]=C(N=C(O2)c1ccccc1)N(CC)CC |
Title of publication | Rhenium and Technetium Complexes with N,N-Dialkyl-N'-benzoylthioureas |
Authors of publication | Nguyen Hung Huy; Ulrich Abram |
Journal of publication | Inorganic Chemistry |
Year of publication | 2007 |
Journal volume | 46 |
Pages of publication | 5310 - 5319 |
a | 20.955 ± 0.009 Å |
b | 15.933 ± 0.009 Å |
c | 16.66 ± 0.01 Å |
α | 90° |
β | 108.5 ± 0.05° |
γ | 90° |
Cell volume | 5275 ± 5 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1237 |
Residual factor for significantly intense reflections | 0.0782 |
Weighted residual factors for significantly intense reflections | 0.1123 |
Weighted residual factors for all reflections included in the refinement | 0.1225 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4308262.html
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Users of the data should acknowledge the original authors of the
structural data.