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Information card for entry 4308263
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Coordinates | 4308263.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | TcClPPh3(PhCONCSNPh2) |
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Chemical name | Bis(N-benzoyl-N',N-diphenylthioureato)chloro(triphenylphosphine)technetium(III) x MeOH |
Formula | C59 H49 Cl N4 O3 P S2 Tc |
Calculated formula | C59 H49 Cl N4 O3 P S2 Tc |
SMILES | [Tc]12(Cl)([S]=C(N=C(O1)c1ccccc1)N(c1ccccc1)c1ccccc1)([S]=C(N=C(O2)c1ccccc1)N(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1.CO |
Title of publication | Rhenium and Technetium Complexes with N,N-Dialkyl-N'-benzoylthioureas |
Authors of publication | Nguyen Hung Huy; Ulrich Abram |
Journal of publication | Inorganic Chemistry |
Year of publication | 2007 |
Journal volume | 46 |
Pages of publication | 5310 - 5319 |
a | 12.729 ± 0.005 Å |
b | 13.286 ± 0.005 Å |
c | 17.181 ± 0.005 Å |
α | 73.34 ± 0.01° |
β | 80.07 ± 0.01° |
γ | 89.27 ± 0.01° |
Cell volume | 2739.9 ± 1.7 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1619 |
Residual factor for significantly intense reflections | 0.0695 |
Weighted residual factors for significantly intense reflections | 0.0947 |
Weighted residual factors for all reflections included in the refinement | 0.1185 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.839 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4308263.html
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Users of the data should acknowledge the original authors of the
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