Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4308676
Preview
Coordinates | 4308676.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | (4) (Cd(DBP)(N(Si(CH3)3)2))2 |
---|---|
Formula | C40 H78 Cd2 N2 O2 Si4 |
Calculated formula | C40 H78 Cd2 N2 O2 Si4 |
SMILES | N([Cd]1[O](c2c(cccc2C(C)(C)C)C(C)(C)C)[Cd](N([Si](C)(C)C)[Si](C)(C)C)[O]1c1c(cccc1C(C)(C)C)C(C)(C)C)([Si](C)(C)C)[Si](C)(C)C |
Title of publication | Cadmium Amido Alkoxide and Alkoxide Precursors for the Synthesis of Nanocrystalline CdE (E = S, Se, Te) |
Authors of publication | Timothy J. Boyle; Scott D. Bunge; Todd M. Alam; Gregory P. Holland; Thomas J. Headley; Gabriel Avilucea |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 1309 - 1318 |
a | 10.1504 ± 0.0017 Å |
b | 11.719 ± 0.002 Å |
c | 20.749 ± 0.004 Å |
α | 90° |
β | 99.894 ± 0.003° |
γ | 90° |
Cell volume | 2431.4 ± 0.7 Å3 |
Cell temperature | 168 ± 2 K |
Ambient diffraction temperature | 168 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1498 |
Residual factor for significantly intense reflections | 0.0731 |
Weighted residual factors for significantly intense reflections | 0.1355 |
Weighted residual factors for all reflections included in the refinement | 0.1864 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.135 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4308676.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.