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Information card for entry 4308675
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Coordinates | 4308675.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | (3) (Cd(N(Si(CH3)3)2)(DIP))2 |
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Formula | C36 H70 Cd2 N2 O2 Si4 |
Calculated formula | C36 H70 Cd2 N2 O2 Si4 |
SMILES | [Cd]1([O]([Cd]([O]1c1c(cccc1C(C)C)C(C)C)N([Si](C)(C)C)[Si](C)(C)C)c1c(cccc1C(C)C)C(C)C)N([Si](C)(C)C)[Si](C)(C)C |
Title of publication | Cadmium Amido Alkoxide and Alkoxide Precursors for the Synthesis of Nanocrystalline CdE (E = S, Se, Te) |
Authors of publication | Timothy J. Boyle; Scott D. Bunge; Todd M. Alam; Gregory P. Holland; Thomas J. Headley; Gabriel Avilucea |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 1309 - 1318 |
a | 17.051 ± 0.002 Å |
b | 17.567 ± 0.002 Å |
c | 31.225 ± 0.004 Å |
α | 90° |
β | 90.139 ± 0.003° |
γ | 90° |
Cell volume | 9353 ± 1.9 Å3 |
Cell temperature | 203 ± 2 K |
Ambient diffraction temperature | 203 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1509 |
Residual factor for significantly intense reflections | 0.1233 |
Weighted residual factors for significantly intense reflections | 0.2643 |
Weighted residual factors for all reflections included in the refinement | 0.2762 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.148 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4308675.html
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