Information card for entry 4310562

Structure parameters

• Common name: [{CeCl(thf)(N(SiMe3)2)2}2]
• Formula: C32 H88 Ce2 Cl2 N4 O2 Si8
• Calculated formula: C32 H88 Ce2 Cl2 N4 O2 Si8
• SMILES: [O]1([Ce]2([Cl][Ce]([O]3CCCC3)([Cl]2)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)CCCC1
• Title of publication: Oxidation in Nonclassical Organolanthanide Chemistry: Synthesis, Characterization, and X-ray Crystal Structures of Cerium(III) and -(IV) Amides
• Authors of publication: Peter B. Hitchcock; Alexander G. Hulkes; Michael F. Lappert
• Journal of publication: Inorganic Chemistry
• Year of publication: 2004
• Journal volume: 43
• Pages of publication: 1031 - 1038
• a: 14.506 ± 0.003 Å
• b: 13.065 ± 0.003 Å
• c: 16.779 ± 0.003 Å
• α: 90°
• β: 113.789 ± 0.012°
• γ: 90°
• Cell volume: 2909.8 ± 1.1 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0876
• Residual factor for significantly intense reflections: 0.0543
• Weighted residual factors for significantly intense reflections: 0.1732
• Weighted residual factors for all reflections included in the refinement: 0.2199
• Goodness-of-fit parameter for all reflections included in the refinement: 0.824
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No