Information card for entry 4312424

Structure parameters

• Formula: C54 H72 Ge N2 P2 Pd S2 Si4
• Calculated formula: C54 H72 Ge N2 P2 Pd S2 Si4
• SMILES: [Ge]1(S[Pd]([P](c2ccccc2)(c2ccccc2)c2ccccc2)([P](c2ccccc2)(c2ccccc2)c2ccccc2)S1)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C.c1ccccc1
• Title of publication: Reactions of Palladium Germylene Complexes: Formation of Sulfide Bridges
• Authors of publication: Zuzanna T. Cygan; Jeff W. Kampf; Mark M. Banaszak Holl
• Journal of publication: Inorganic Chemistry
• Year of publication: 2003
• Journal volume: 42
• Pages of publication: 7219 - 7226
• a: 13.0526 ± 0.0014 Å
• b: 20.666 ± 0.002 Å
• c: 22.719 ± 0.002 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 6128.3 ± 1 ų
• Cell temperature: 158 ± 2 K
• Ambient diffraction temperature: 158 ± 2 K
• Number of distinct elements: 8
• Space group number: 19
• Hermann-Mauguin space group symbol: P 21 21 21
• Hall space group symbol: P 2ac 2ab
• Residual factor for all reflections: 0.0432
• Residual factor for significantly intense reflections: 0.0352
• Weighted residual factors for significantly intense reflections: 0.077
• Weighted residual factors for all reflections included in the refinement: 0.0799
• Goodness-of-fit parameter for all reflections included in the refinement: 1.049
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No