Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4314801
Preview
Coordinates | 4314801.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C48 H92 Cl8 N2 O P4 Pd2 |
---|---|
Calculated formula | C48 H92 Cl8 N2 O P4 Pd2 |
SMILES | [Pd]12(Cl)[n]3c(cccc3C[P]1(C(C)(C)C)C(C)(C)C)C[P]2(C(C)(C)C)C(C)(C)C.[Cl-].C(Cl)Cl.O |
Title of publication | Cationic, Neutral, and Anionic PNP PdII and PtII Complexes: Dearomatization by Deprotonation and Double-Deprotonation of Pincer Systems |
Authors of publication | Moran Feller; Eyal Ben-Ari; Mark A. Iron; Yael Diskin-Posner; Gregory Leitus; Linda J. W. Shimon; Leonid Konstantinovski; David Milstein |
Journal of publication | Inorganic Chemistry |
Year of publication | 2010 |
Journal volume | 49 |
Pages of publication | 1615 - 1625 |
a | 11.2479 ± 0.0007 Å |
b | 16.8435 ± 0.0011 Å |
c | 17.2519 ± 0.0011 Å |
α | 77.101 ± 0.003° |
β | 78.669 ± 0.003° |
γ | 87.601 ± 0.003° |
Cell volume | 3123.9 ± 0.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.033 |
Residual factor for significantly intense reflections | 0.024 |
Weighted residual factors for significantly intense reflections | 0.0538 |
Weighted residual factors for all reflections included in the refinement | 0.0588 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4314801.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.