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Information card for entry 4316986
Preview
| Coordinates | 4316986.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | amidinate silylene nickel carbony complex |
|---|---|
| Chemical name | could not be determined |
| Formula | C18 H23 Cl N2 Ni O3 Si |
| Calculated formula | C18 H23 Cl N2 Ni O3 Si |
| SMILES | [Ni](C#[O])(C#[O])(C#[O])[Si]1(Cl)N(C(=[N]1C(C)(C)C)c1ccccc1)C(C)(C)C |
| Title of publication | Facile Syntheses of Silylene Nickel Carbonyl Complexes from Lewis Base Stabilized Chlorosilylenes |
| Authors of publication | Gašper Tavčar; Sakya S. Sen; Ramachandran Azhakar; Andrea Thorn; Herbert W. Roesky |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2010 |
| Journal volume | 49 |
| Pages of publication | 10199 - 10202 |
| a | 13.942 ± 0.003 Å |
| b | 11.524 ± 0.002 Å |
| c | 13.737 ± 0.003 Å |
| α | 90° |
| β | 111.24 ± 0.03° |
| γ | 90° |
| Cell volume | 2057.2 ± 0.8 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0275 |
| Residual factor for significantly intense reflections | 0.0271 |
| Weighted residual factors for significantly intense reflections | 0.0753 |
| Weighted residual factors for all reflections included in the refinement | 0.0755 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.147 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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