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Information card for entry 4319717
Preview
| Coordinates | 4319717.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | K3 La P2 Se8 |
|---|---|
| Calculated formula | K3 La P2 Se8 |
| Title of publication | Selenophosphate Phase Diagrams Developed in Conjunction with the Synthesis of the New Compounds K2La(P2Se6)1/2(PSe4), K3La(PSe4)2, K4La0.67(PSe4)2, K9-xLa1+x/3(PSe4)4 (x = 0.5), and KEuPSe4 |
| Authors of publication | Evenson; Peter K. Dorhout |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2001 |
| Journal volume | 40 |
| Pages of publication | 2875 - 2883 |
| a | 9.5782 ± 0.0002 Å |
| b | 17.6623 ± 0.0004 Å |
| c | 9.9869 ± 0.0003 Å |
| α | 90° |
| β | 90.12 ± 0.001° |
| γ | 90° |
| Cell volume | 1689.51 ± 0.07 Å3 |
| Cell temperature | 170 ± 2 K |
| Ambient diffraction temperature | 170 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0773 |
| Residual factor for significantly intense reflections | 0.0476 |
| Weighted residual factors for all reflections | 0.1161 |
| Weighted residual factors for significantly intense reflections | 0.1036 |
| Goodness-of-fit parameter for all reflections | 1.054 |
| Goodness-of-fit parameter for significantly intense reflections | 1.106 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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