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Information card for entry 4319718
Preview
| Coordinates | 4319718.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | K4 La0.67 P2 Se8 |
|---|---|
| Calculated formula | K4 La0.67 P2 Se8 |
| Title of publication | Selenophosphate Phase Diagrams Developed in Conjunction with the Synthesis of the New Compounds K2La(P2Se6)1/2(PSe4), K3La(PSe4)2, K4La0.67(PSe4)2, K9-xLa1+x/3(PSe4)4 (x = 0.5), and KEuPSe4 |
| Authors of publication | Evenson; Peter K. Dorhout |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2001 |
| Journal volume | 40 |
| Pages of publication | 2875 - 2883 |
| a | 19.0962 ± 0.0002 Å |
| b | 9.1408 ± 0.0001 Å |
| c | 10.2588 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1790.72 ± 0.04 Å3 |
| Cell temperature | 159 ± 2 K |
| Ambient diffraction temperature | 159 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 72 |
| Hermann-Mauguin space group symbol | I b a m |
| Hall space group symbol | -I 2 2c |
| Residual factor for all reflections | 0.0473 |
| Residual factor for significantly intense reflections | 0.0353 |
| Weighted residual factors for all reflections | 0.0812 |
| Weighted residual factors for significantly intense reflections | 0.0755 |
| Goodness-of-fit parameter for all reflections | 1.106 |
| Goodness-of-fit parameter for significantly intense reflections | 1.125 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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