Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4321952
Preview
Coordinates | 4321952.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C35 H61 Cl4 N5 O17 Pd |
---|---|
Calculated formula | C35 H61 Cl4 N5 O17 Pd |
SMILES | [Pd]12(Cl)[N]3(C)CC[N]1(C)Cc1ccc(cc1)C[NH+]1CCOCCOCC[NH+](CCOCCOCC1)Cc1ccc(cc1)C[N]2(C)CC3.O.Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-] |
Title of publication | Palladium(II) Complexation byp-Cyclophane Receptors. A Solution and Solid State Study |
Authors of publication | Andrea Bencini; Antonio Bianchi; Vieri Fusi; Claudia Giorgi; Piero Paoletti; Jose; Antonio; Ramirez'; Barbara Valtancoli |
Journal of publication | Inorganic Chemistry |
Year of publication | 1999 |
Journal volume | 38 |
Pages of publication | 2064 - 2070 |
a | 23.739 ± 0.005 Å |
b | 13.37 ± 0.005 Å |
c | 14.903 ± 0.005 Å |
α | 90 ± 0.005° |
β | 90 ± 0.005° |
γ | 90 ± 0.005° |
Cell volume | 4730 ± 3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 29 |
Hermann-Mauguin space group symbol | P c a 21 |
Hall space group symbol | P 2c -2ac |
Residual factor for all reflections | 0.2359 |
Residual factor for significantly intense reflections | 0.064 |
Weighted residual factors for all reflections | 0.2261 |
Weighted residual factors for significantly intense reflections | 0.151 |
Goodness-of-fit parameter for all reflections | 0.987 |
Goodness-of-fit parameter for significantly intense reflections | 1.106 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4321952.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.