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Information card for entry 4321982
Preview
| Coordinates | 4321982.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | F4 Li O2 Re |
|---|---|
| Calculated formula | F4 Li O2 Re |
| SMILES | F[Re](=O)(F)(F)(F)=O.[Li+] |
| Title of publication | Lewis Acid Behavior of ReO2F3: Synthesis of (ReO2F3)\ιnfty, ReO2F4-, Re2O4F7-, Re3O6F10-, and ReO2F3(CH3CN) and Study by NMR Spectroscopy, Raman Spectroscopy, and Density Functional Theory Calculations; and X-ray Structures of [Li][ReO2F4], [K][Re2O4F7], [K][Re2O4F7].2ReO2F3, [Cs][Re3O6F10], and ReO3F(CH3CN)2.CH3CN |
| Authors of publication | William J. Casteel; David A. Dixon; Nicolas LeBlond; Philippa E. Lock; Hélène P. A. Mercier; Gary J. Schrobilgen |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1999 |
| Journal volume | 38 |
| Pages of publication | 2340 - 2358 |
| a | 4.727 ± 0.003 Å |
| b | 4.727 ± 0.003 Å |
| c | 8.88 ± 0.007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 198.4 ± 0.2 Å3 |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 113 |
| Hermann-Mauguin space group symbol | P -4 21 m |
| Hall space group symbol | P -4 2ab |
| Residual factor for all reflections | 0.0397 |
| Residual factor for significantly intense reflections | 0.0378 |
| Weighted residual factors for all reflections | 0.1084 |
| Weighted residual factors for significantly intense reflections | 0.1029 |
| Goodness-of-fit parameter for all reflections | 1.207 |
| Goodness-of-fit parameter for significantly intense reflections | 1.2 |
| Diffraction radiation wavelength | 0.56086 Å |
| Diffraction radiation type | AgKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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