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Information card for entry 4322232
Preview
| Coordinates | 4322232.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C5 H12 Cl2 N2 S Se |
|---|---|
| Calculated formula | C5 H12 Cl2 N2 S Se |
| SMILES | [Se](Cl)[S]=C(N(C)C)N(C)C.[Cl-] |
| Title of publication | Syntheses of THF Solutions of SeX2 (X = Cl, Br) and a New Route to Selenium Sulfides SenS8-n (n= 1-5): X-ray Crystal Structures of SeCl2(tht)2 and SeCl2.tmtu |
| Authors of publication | Arto Maaninen; Tristram Chivers; Masood Parvez; Jarkko Pietikäinen; Risto S. Laitinen |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1999 |
| Journal volume | 38 |
| Pages of publication | 4093 - 4097 |
| a | 8.473 ± 0.003 Å |
| b | 9.236 ± 0.003 Å |
| c | 7.709 ± 0.004 Å |
| α | 109.9 ± 0.03° |
| β | 92.26 ± 0.04° |
| γ | 107.89 ± 0.03° |
| Cell volume | 532.8 ± 0.4 Å3 |
| Cell temperature | 170.2 K |
| Ambient diffraction temperature | 170.2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0517 |
| Residual factor for significantly intense reflections | 0.0517 |
| Weighted residual factors for all reflections | 0.0484 |
| Weighted residual factors for significantly intense reflections | 0.0484 |
| Goodness-of-fit parameter for all reflections | 2.099 |
| Goodness-of-fit parameter for significantly intense reflections | 2.099 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4322232.html
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