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Information card for entry 4322232
Preview
Coordinates | 4322232.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C5 H12 Cl2 N2 S Se |
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Calculated formula | C5 H12 Cl2 N2 S Se |
SMILES | [Se](Cl)[S]=C(N(C)C)N(C)C.[Cl-] |
Title of publication | Syntheses of THF Solutions of SeX2 (X = Cl, Br) and a New Route to Selenium Sulfides SenS8-n (n= 1-5): X-ray Crystal Structures of SeCl2(tht)2 and SeCl2.tmtu |
Authors of publication | Arto Maaninen; Tristram Chivers; Masood Parvez; Jarkko Pietikäinen; Risto S. Laitinen |
Journal of publication | Inorganic Chemistry |
Year of publication | 1999 |
Journal volume | 38 |
Pages of publication | 4093 - 4097 |
a | 8.473 ± 0.003 Å |
b | 9.236 ± 0.003 Å |
c | 7.709 ± 0.004 Å |
α | 109.9 ± 0.03° |
β | 92.26 ± 0.04° |
γ | 107.89 ± 0.03° |
Cell volume | 532.8 ± 0.4 Å3 |
Cell temperature | 170.2 K |
Ambient diffraction temperature | 170.2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0517 |
Residual factor for significantly intense reflections | 0.0517 |
Weighted residual factors for all reflections | 0.0484 |
Weighted residual factors for significantly intense reflections | 0.0484 |
Goodness-of-fit parameter for all reflections | 2.099 |
Goodness-of-fit parameter for significantly intense reflections | 2.099 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4322232.html
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