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Information card for entry 4322354
Preview
Coordinates | 4322354.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H86 B2 Ge Li2 N4 O4 P2 |
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Calculated formula | C44 H86 B2 Ge Li2 N4 O4 P2 |
SMILES | [Ge]1([P]2(B(N(C(C)C)C(C)C)N(C(C)C)C(C)C)[Li]3([P]1(B(N(C(C)C)C(C)C)N(C(C)C)C(C)C)[Li]12[O](CC[O]1C)C)[O](CC[O]3C)C)(c1ccccc1)c1ccccc1 |
Title of publication | Synthesis and Chemistry of Bis(borylphosphino)silanes and -germanes |
Authors of publication | Tuqiang Chen; Eileen N. Duesler; Robert T. Paine; Heinrich Nöth |
Journal of publication | Inorganic Chemistry |
Year of publication | 1999 |
Journal volume | 38 |
Pages of publication | 4993 - 4999 |
a | 11.083 ± 0.001 Å |
b | 14.978 ± 0.001 Å |
c | 18.134 ± 0.002 Å |
α | 91.17 ± 0.001° |
β | 101.43 ± 0.01° |
γ | 110.05 ± 0.01° |
Cell volume | 2758.9 ± 0.5 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0896 |
Residual factor for significantly intense reflections | 0.0417 |
Weighted residual factors for significantly intense reflections | 0.081 |
Weighted residual factors for all reflections included in the refinement | 0.0918 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4322354.html
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