Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4322926
Preview
Coordinates | 4322926.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | [Dimethyl(1,10-phenanthroline)bis(selenato)platinum(IV)] |
---|---|
Formula | C26 H24 N2 Pt Se2 |
Calculated formula | C26 H24 N2 Pt Se2 |
Title of publication | Oxidation of Complexes by (O2CPh)2 and (ER)2 (E = S, Se), Including Structures of Pd(CH2CH2CH2CH2)(SePh)2(bpy) (bpy = 2,2'-Bipyridine) and MMe2(SePh)2(L2) (M = Pd, Pt; L2= bpy, 1,10-Phenanthroline) and C...O and C...E Bond Formation at Palladium(IV) |
Authors of publication | Allan J. Canty; Hong Jin; Brian W. Skelton; Allan H. White |
Journal of publication | Inorganic Chemistry |
Year of publication | 1998 |
Journal volume | 37 |
Pages of publication | 3975 - 3981 |
a | 11.759 ± 0.006 Å |
b | 11.094 ± 0.006 Å |
c | 9.976 ± 0.006 Å |
α | 66.13 ± 0.04° |
β | 86.01 ± 0.04° |
γ | 81.46 ± 0.04° |
Cell volume | 1176.8 ± 1.2 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.055 |
Residual factor for significantly intense reflections | 0.039 |
Weighted residual factors for all reflections | 0.053 |
Weighted residual factors for significantly intense reflections | 0.049 |
Goodness-of-fit parameter for all reflections | 1.316 |
Goodness-of-fit parameter for significantly intense reflections | 1.374 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | Mo_K |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4322926.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.