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Information card for entry 4322927
Preview
| Coordinates | 4322927.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | [Dimethyl(1,10-phenanthroline)bis(selenophenolato)platinum(IV)] |
|---|---|
| Formula | C26 H24 N2 Pt Se2 |
| Calculated formula | C26 H24 N2 Pt Se2 |
| Title of publication | Oxidation of Complexes by (O2CPh)2 and (ER)2 (E = S, Se), Including Structures of Pd(CH2CH2CH2CH2)(SePh)2(bpy) (bpy = 2,2'-Bipyridine) and MMe2(SePh)2(L2) (M = Pd, Pt; L2= bpy, 1,10-Phenanthroline) and C...O and C...E Bond Formation at Palladium(IV) |
| Authors of publication | Allan J. Canty; Hong Jin; Brian W. Skelton; Allan H. White |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1998 |
| Journal volume | 37 |
| Pages of publication | 3975 - 3981 |
| a | 13.874 ± 0.003 Å |
| b | 13.874 ± 0.003 Å |
| c | 25.14 ± 0.03 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4839 ± 6 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 88 |
| Hermann-Mauguin space group symbol | I 41/a :2 |
| Hall space group symbol | -I 4ad |
| Residual factor for all reflections | 0.074 |
| Residual factor for significantly intense reflections | 0.036 |
| Weighted residual factors for all reflections | 0.058 |
| Weighted residual factors for significantly intense reflections | 0.043 |
| Goodness-of-fit parameter for all reflections | 1.103 |
| Goodness-of-fit parameter for significantly intense reflections | 1.078 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | Mo_K |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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