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Information card for entry 4323214
Preview
Coordinates | 4323214.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H66 Ge N2 O2 P2 Pt Si4 |
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Calculated formula | C24 H66 Ge N2 O2 P2 Pt Si4 |
SMILES | [Pt]1([Ge](OO1)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)([P](CC)(CC)CC)[P](CC)(CC)CC |
Title of publication | Active Role of a Germylene Ligand in Promoting Reactions of Platinum Complexes with Oxygen and Sulfur Dioxide |
Authors of publication | K. E. Litz; M. M. Banaszak Holl; J. W. Kampf; G. B. Carpenter |
Journal of publication | Inorganic Chemistry |
Year of publication | 1998 |
Journal volume | 37 |
Pages of publication | 6461 - 6469 |
a | 11.689 ± 0.002 Å |
b | 18.753 ± 0.002 Å |
c | 19.16 ± 0.002 Å |
α | 108.74 ± 0.01° |
β | 97.56 ± 0.01° |
γ | 95.44 ± 0.01° |
Cell volume | 3900.5 ± 0.9 Å3 |
Cell temperature | 148 ± 2 K |
Ambient diffraction temperature | 148 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.075 |
Residual factor for significantly intense reflections | 0.055 |
Weighted residual factors for all reflections | 0.1488 |
Weighted residual factors for significantly intense reflections | 0.1421 |
Goodness-of-fit parameter for all reflections | 1.085 |
Goodness-of-fit parameter for significantly intense reflections | 1.225 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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