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Information card for entry 4323215
Preview
Coordinates | 4323215.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H66 Ge N2 O2 P2 Pt Si4 |
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Calculated formula | C24 H66 Ge N2 O2 P2 Pt Si4 |
SMILES | [Pt]1(O[Ge](O1)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)([P](CC)(CC)CC)[P](CC)(CC)CC |
Title of publication | Active Role of a Germylene Ligand in Promoting Reactions of Platinum Complexes with Oxygen and Sulfur Dioxide |
Authors of publication | K. E. Litz; M. M. Banaszak Holl; J. W. Kampf; G. B. Carpenter |
Journal of publication | Inorganic Chemistry |
Year of publication | 1998 |
Journal volume | 37 |
Pages of publication | 6461 - 6469 |
a | 12.346 ± 0.003 Å |
b | 17.752 ± 0.003 Å |
c | 20.521 ± 0.005 Å |
α | 68.97 ± 0.02° |
β | 81.76 ± 0.02° |
γ | 74.07 ± 0.02° |
Cell volume | 4031.7 ± 1.7 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1263 |
Residual factor for significantly intense reflections | 0.0633 |
Weighted residual factors for all reflections | 0.1715 |
Weighted residual factors for significantly intense reflections | 0.1498 |
Goodness-of-fit parameter for all reflections | 0.887 |
Goodness-of-fit parameter for significantly intense reflections | 1.087 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4323215.html
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