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Information card for entry 4324001
Preview
| Coordinates | 4324001.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C74 H46 Ag F20 O P3 Pt2 |
|---|---|
| Calculated formula | C74 H45 Ag F20 O P3 Pt2 |
| Title of publication | Direct Ag-Pt2 Interactions in Pentafluorophenyl A-Frame Complexes Containing Halide or OH-and Bis(diphenylphosphino)methane (dppm) as Bridging Ligands. Crystal Structures of [(C6F5)2Pt(μ-OH)(μ-dppm){Ag(PPh3)}Pt(C6F5)2].C7H8 and [(C6F5)2Pt(μ-SC4H8)(μ-dppm)Pt(C6F5)2].1/2C6H14 |
| Authors of publication | José María Casas; Larry R. Falvello; Juan Forniés; Antonio Martín |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1996 |
| Journal volume | 35 |
| Pages of publication | 7867 - 7872 |
| a | 14.36 ± 0.0009 Å |
| b | 21.5898 ± 0.0013 Å |
| c | 21.585 ± 0.002 Å |
| α | 90° |
| β | 90.846 ± 0.012° |
| γ | 90° |
| Cell volume | 6691.3 ± 0.9 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.119 |
| Residual factor for significantly intense reflections | 0.0546 |
| Weighted residual factors for all reflections | 0.1032 |
| Weighted residual factors for significantly intense reflections | 0.0846 |
| Goodness-of-fit parameter for all reflections | 1.046 |
| Goodness-of-fit parameter for significantly intense reflections | 1.081 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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