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Information card for entry 4324002
Preview
| Coordinates | 4324002.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C56 H37 F20 P2 Pt2 S |
|---|---|
| Calculated formula | C56 H37 F20 P2 Pt2 S |
| Title of publication | Direct Ag-Pt2 Interactions in Pentafluorophenyl A-Frame Complexes Containing Halide or OH-and Bis(diphenylphosphino)methane (dppm) as Bridging Ligands. Crystal Structures of [(C6F5)2Pt(μ-OH)(μ-dppm){Ag(PPh3)}Pt(C6F5)2].C7H8 and [(C6F5)2Pt(μ-SC4H8)(μ-dppm)Pt(C6F5)2].1/2C6H14 |
| Authors of publication | José María Casas; Larry R. Falvello; Juan Forniés; Antonio Martín |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1996 |
| Journal volume | 35 |
| Pages of publication | 7867 - 7872 |
| a | 22.258 ± 0.006 Å |
| b | 11.351 ± 0.003 Å |
| c | 22.268 ± 0.005 Å |
| α | 90° |
| β | 106.21 ± 0.03° |
| γ | 90° |
| Cell volume | 5402 ± 3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0761 |
| Residual factor for significantly intense reflections | 0.0444 |
| Weighted residual factors for all reflections | 0.1174 |
| Weighted residual factors for significantly intense reflections | 0.103 |
| Goodness-of-fit parameter for all reflections | 1.06 |
| Goodness-of-fit parameter for significantly intense reflections | 1.117 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4324002.html
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