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Information card for entry 4324235
Preview
Coordinates | 4324235.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H92 Cl2 Li4 N6 O4 U |
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Calculated formula | C40 H92 Cl2 Li4 N6 O4 U |
SMILES | [Li]([O]1CCCC1)[O]1CCCC1.[Cl-].[U]1234([NH](C(C)(C)C)[Li]([NH]1C(C)(C)C)[NH]3C(C)(C)C)[NH](C(C)(C)C)[Li]([NH]2C(C)(C)C)[NH]4C(C)(C)C.[Li]([O]1CCCC1)[O]1CCCC1.[Cl-] |
Title of publication | Comparison of the Redox Chemistry of Primary and Secondary Amides of U(IV): Isolation of a U(VI) Bis(imido) Complex or a Homoleptic U(VI) Amido Complex |
Authors of publication | Lani A. Seaman; Skye Fortier; Guang Wu; Trevor W. Hayton |
Journal of publication | Inorganic Chemistry |
Year of publication | 2011 |
Journal volume | 50 |
Pages of publication | 636 - 646 |
a | 10.6583 ± 0.0006 Å |
b | 19.1616 ± 0.0011 Å |
c | 13.8312 ± 0.0008 Å |
α | 90° |
β | 103.576 ± 0.002° |
γ | 90° |
Cell volume | 2745.8 ± 0.3 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0745 |
Residual factor for significantly intense reflections | 0.0447 |
Weighted residual factors for significantly intense reflections | 0.1099 |
Weighted residual factors for all reflections included in the refinement | 0.1227 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.938 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4324235.html
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