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Information card for entry 4324236
Preview
Coordinates | 4324236.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C46 H108 Cl2 Li4 N6 O8 U |
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Calculated formula | C46 H108 Cl2 Li4 N6 O8 U |
SMILES | [U](N([Li]12[Cl][Li]34([O](C)CC[O]3C)[O](C)CC[O]4C)C(C)(C)C)(N1C(C)(C)C)(N2C(C)(C)C)(N([Li]12[Cl][Li]34([O](C)CC[O]3C)[O](C)CC[O]4C)C(C)(C)C)(N1C(C)(C)C)N2C(C)(C)C.C(C)CCCC |
Title of publication | Comparison of the Redox Chemistry of Primary and Secondary Amides of U(IV): Isolation of a U(VI) Bis(imido) Complex or a Homoleptic U(VI) Amido Complex |
Authors of publication | Lani A. Seaman; Skye Fortier; Guang Wu; Trevor W. Hayton |
Journal of publication | Inorganic Chemistry |
Year of publication | 2011 |
Journal volume | 50 |
Pages of publication | 636 - 646 |
a | 10.866 ± 0.005 Å |
b | 11.072 ± 0.005 Å |
c | 14.719 ± 0.007 Å |
α | 78.666 ± 0.007° |
β | 77.331 ± 0.007° |
γ | 71.05 ± 0.007° |
Cell volume | 1618.9 ± 1.3 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0409 |
Residual factor for significantly intense reflections | 0.0408 |
Weighted residual factors for significantly intense reflections | 0.1081 |
Weighted residual factors for all reflections included in the refinement | 0.1082 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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