Information card for entry 4327192

Structure parameters

• Formula: C34 H54 Cu N2 O5 S
• Calculated formula: C34 H54 Cu N2 O5 S
• Title of publication: Structural, Magnetic, and Electronic Properties of Phenolic Oxime Complexes of Cu and Ni
• Authors of publication: Alexander M. Whyte; Benjamin Roach; David K. Henderson; Peter A. Tasker; Michio M. Matsushita; Kunio Awaga; Fraser J. White; Patricia Richardson; Neil Robertson
• Journal of publication: Inorganic Chemistry
• Year of publication: 2011
• Journal volume: 50
• Pages of publication: 12867 - 12876
• a: 8.042 ± 0.0004 Å
• b: 12.851 ± 0.0008 Å
• c: 17.672 ± 0.001 Å
• α: 99.417 ± 0.004°
• β: 97.842 ± 0.003°
• γ: 104.953 ± 0.003°
• Cell volume: 1709.88 ± 0.17 ų
• Cell temperature: 150 K
• Ambient diffraction temperature: 150 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0849
• Residual factor for significantly intense reflections: 0.0539
• Weighted residual factors for all reflections: 0.1636
• Weighted residual factors for significantly intense reflections: 0.1325
• Weighted residual factors for all reflections included in the refinement: 0.1636
• Goodness-of-fit parameter for all reflections included in the refinement: 1.0029
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No