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Information card for entry 4327315
Preview
Coordinates | 4327315.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C62 H53 Cl6 P4 Rh S2 |
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Calculated formula | C60 H49 Cl2 P4 Rh S2 |
SMILES | [Rh]12(Cl)(Cl)([S]=P(C3[P]2(C(=P(S1)(c1ccccc1)c1ccccc1)C(=CC=3c1ccccc1)c1ccccc1)C)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Synthesis and X-ray Crystal Structure of a Cationic Homoleptic (SPS)2Rh(III) Complex and EPR Study of Its Reduction Process |
Authors of publication | Marjolaine Doux; Nicolas Mézailles; Louis Ricard; Pascal Le Floch; Prashant Adkine; Théo Berclaz; Michel Geoffroy |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 1147 - 1152 |
a | 13.351 ± 0.005 Å |
b | 13.715 ± 0.005 Å |
c | 17.502 ± 0.005 Å |
α | 82.88 ± 0.005° |
β | 74.84 ± 0.005° |
γ | 68.81 ± 0.005° |
Cell volume | 2882.6 ± 1.7 Å3 |
Cell temperature | 150 ± 1 K |
Ambient diffraction temperature | 150 ± 1 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0491 |
Residual factor for significantly intense reflections | 0.0401 |
Weighted residual factors for significantly intense reflections | 0.1179 |
Weighted residual factors for all reflections included in the refinement | 0.1246 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4327315.html
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