Information card for entry 4329823

Structure parameters

• Formula: C35 H54 Cl2 Ge N3 P Rh
• Calculated formula: C35 H54 Cl2 Ge N3 P Rh
• SMILES: [Rh]1234([Ge](Cl)(Cl)N(C5=C([P@]61N(CCN6C(C)C)C(=C)C)[C@H]1CC[C@@H]5C1)c1c(cccc1C(C)C)C(C)C)[CH]1=[CH]2CC[CH]3=[CH]4CC1.[Rh]1234([Ge](Cl)(Cl)N(C5=C([P@@]61N(CCN6C(C)C)C(=C)C)[C@@H]1CC[C@H]5C1)c1c(cccc1C(C)C)C(C)C)[CH]1=[CH]2CC[CH]3=[CH]4CC1
• Title of publication: Synthesis and Characterization of Rhodium Complexes with Phosphine-Stabilized Germylenes
• Authors of publication: Juan Manuel García; Edgar Ocando Mavárez; Tsuyoshi Kato; David Santiago Coll; Alexander Briceño; Nathalie Saffon-Merceron; Antoine Bacereido
• Journal of publication: Inorganic Chemistry
• Year of publication: 2012
• Journal volume: 51
• Pages of publication: 8187 - 8193
• a: 32.83 ± 0.008 Å
• b: 39.87 ± 0.007 Å
• c: 11.24 ± 0.003 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 14712 ± 6 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 7
• Space group number: 43
• Hermann-Mauguin space group symbol: F d d 2
• Hall space group symbol: F 2 -2d
• Residual factor for all reflections: 0.043
• Residual factor for significantly intense reflections: 0.0307
• Weighted residual factors for significantly intense reflections: 0.0692
• Weighted residual factors for all reflections included in the refinement: 0.08
• Goodness-of-fit parameter for all reflections included in the refinement: 1.179
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No