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Information card for entry 4337900
Preview
Coordinates | 4337900.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H40 Al Bi Cl4 N2 Si |
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Calculated formula | C26 H40 Al Bi Cl4 N2 Si |
SMILES | [Bi]1([Cl][Al](Cl)(Cl)Cl)N(c2c(cccc2C(C)C)C(C)C)[Si](N1c1c(cccc1C(C)C)C(C)C)(C)C |
Title of publication | Low-Coordinate Bismuth Cations. |
Authors of publication | Schwamm, Ryan J.; Day, Benjamin M.; Coles, Martyn P.; Fitchett, Christopher M. |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 7 |
Pages of publication | 3778 |
a | 24.9726 ± 0.001 Å |
b | 16.6486 ± 0.0004 Å |
c | 16.1717 ± 0.0006 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6723.5 ± 0.4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P b c n |
Hall space group symbol | -P 2n 2ab |
Residual factor for all reflections | 0.1307 |
Residual factor for significantly intense reflections | 0.0767 |
Weighted residual factors for significantly intense reflections | 0.1631 |
Weighted residual factors for all reflections included in the refinement | 0.1886 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.018 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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