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Information card for entry 4337901
Preview
Coordinates | 4337901.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C58 H94 Bi2 Cl5 Ga N4 Si2 |
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Calculated formula | C58 H94 Bi2 Cl5 Ga N4 Si2 |
SMILES | [Bi]1([Cl][Bi]2N(c3c(cccc3C(C)C)C(C)C)[Si](N2c2c(cccc2C(C)C)C(C)C)(C)C)N(c2c(cccc2C(C)C)C(C)C)[Si](N1c1c(cccc1C(C)C)C(C)C)(C)C.[Ga]([Cl-])(Cl)(Cl)Cl.CCCCCC |
Title of publication | Low-Coordinate Bismuth Cations. |
Authors of publication | Schwamm, Ryan J.; Day, Benjamin M.; Coles, Martyn P.; Fitchett, Christopher M. |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 7 |
Pages of publication | 3778 |
a | 12.8472 ± 0.0005 Å |
b | 17.0713 ± 0.0007 Å |
c | 17.4081 ± 0.0007 Å |
α | 117.739 ± 0.004° |
β | 92.142 ± 0.003° |
γ | 90.447 ± 0.003° |
Cell volume | 3375.4 ± 0.3 Å3 |
Cell temperature | 120.01 ± 0.1 K |
Ambient diffraction temperature | 120 ± 0.1 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0402 |
Residual factor for significantly intense reflections | 0.0306 |
Weighted residual factors for significantly intense reflections | 0.0733 |
Weighted residual factors for all reflections included in the refinement | 0.0799 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4337901.html
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