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Information card for entry 4340671
Preview
Coordinates | 4340671.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C21 H63 Br N4 Si7 U |
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Calculated formula | C21 H63 Br N4 Si7 U |
SMILES | [U](N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)(=N[Si](C)(C)C)Br |
Title of publication | Anomalous one-electron processes in the chemistry of uranium nitrogen multiple bonds. |
Authors of publication | Mullane, Kimberly C.; Lewis, Andrew J.; Yin, Haolin; Carroll, Patrick J.; Schelter, Eric J. |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 17 |
Pages of publication | 9129 - 9139 |
a | 10.8318 ± 0.0005 Å |
b | 14.4441 ± 0.0007 Å |
c | 15.3636 ± 0.0008 Å |
α | 115.787 ± 0.002° |
β | 91.353 ± 0.003° |
γ | 90.503 ± 0.003° |
Cell volume | 2163.26 ± 0.19 Å3 |
Cell temperature | 100 ± 1 K |
Ambient diffraction temperature | 100 ± 1 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1002 |
Residual factor for significantly intense reflections | 0.0795 |
Weighted residual factors for significantly intense reflections | 0.2036 |
Weighted residual factors for all reflections included in the refinement | 0.2165 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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