Information card for entry 4340672

Structure parameters

• Formula: C21 H63 Cl N4 Si7 U
• Calculated formula: C21 H63 Cl N4 Si7 U
• SMILES: [U](Cl)(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)=N[Si](C)(C)C
• Title of publication: Anomalous one-electron processes in the chemistry of uranium nitrogen multiple bonds.
• Authors of publication: Mullane, Kimberly C.; Lewis, Andrew J.; Yin, Haolin; Carroll, Patrick J.; Schelter, Eric J.
• Journal of publication: Inorganic chemistry
• Year of publication: 2014
• Journal volume: 53
• Journal issue: 17
• Pages of publication: 9129 - 9139
• a: 10.5302 ± 0.0003 Å
• b: 15.0003 ± 0.0005 Å
• c: 15.5426 ± 0.0006 Å
• α: 62.862 ± 0.002°
• β: 88.96 ± 0.002°
• γ: 89.721 ± 0.002°
• Cell volume: 2184.4 ± 0.13 ų
• Cell temperature: 100 ± 1 K
• Ambient diffraction temperature: 100 ± 1 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1295
• Residual factor for significantly intense reflections: 0.1034
• Weighted residual factors for significantly intense reflections: 0.2855
• Weighted residual factors for all reflections included in the refinement: 0.3016
• Goodness-of-fit parameter for all reflections included in the refinement: 1.102
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No