Information card for entry 4341030

Structure parameters

• Formula: C32 H88 N4 O2 S Si8 Y2
• Calculated formula: C32 H88 N4 O2 S Si8 Y2
• SMILES: C[Si](C)(N([Y](N([Si](C)(C)C)[Si](C)(C)C)([O]1CCCC1)S[Y](N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)[O]1CCCC1)[Si](C)(C)C)C
• Title of publication: Cocrystallization of (μ-S2)(2-) and (μ-S)(2-) and Formation of an [η(2)-S3N(SiMe3)2] Ligand from Chalcogen Reduction by (N2)(2-) in a Bimetallic Yttrium Amide Complex.
• Authors of publication: Corbey, Jordan F.; Fang, Ming; Ziller, Joseph W.; Evans, William J.
• Journal of publication: Inorganic chemistry
• Year of publication: 2015
• Journal volume: 54
• Journal issue: 3
• Pages of publication: 801 - 807
• a: 10.429 ± 0.004 Å
• b: 12.16 ± 0.004 Å
• c: 12.166 ± 0.004 Å
• α: 61.535 ± 0.004°
• β: 80.236 ± 0.005°
• γ: 89.078 ± 0.005°
• Cell volume: 1332.9 ± 0.8 ų
• Cell temperature: 143 ± 2 K
• Ambient diffraction temperature: 143 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0625
• Residual factor for significantly intense reflections: 0.0413
• Weighted residual factors for significantly intense reflections: 0.0922
• Weighted residual factors for all reflections included in the refinement: 0.1002
• Goodness-of-fit parameter for all reflections included in the refinement: 1.013
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No