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Information card for entry 4342150
Preview
Coordinates | 4342150.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C63 H86 Ga4 N6 O |
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Calculated formula | C63 H86 Ga4 N6 O |
SMILES | [Ga]12([O]([Ga](C)([N](=C(N1)c1ccccc1)c1c(C(C)C)cccc1C(C)C)C)[Ga]1(N([Ga]([N](=C(N1)c1ccccc1)c1c(C(C)C)cccc1C(C)C)(C)C)C(=[N]2c1c(C(C)C)cccc1C(C)C)c1ccccc1)C)C |
Title of publication | Insertion of benzonitrile into Al-N and ga-N bonds: formation of fused carbatriaza-gallanes/alanes and their subsequent synthesis from amidines and trimethyl-gallium/aluminum. |
Authors of publication | Maheswari, K.; Rao, A. Ramakrishna; Reddy, N. Dastagiri |
Journal of publication | Inorganic chemistry |
Year of publication | 2015 |
Journal volume | 54 |
Journal issue | 4 |
Pages of publication | 2000 - 2008 |
a | 10.7317 ± 0.0003 Å |
b | 14.9692 ± 0.0004 Å |
c | 19.2449 ± 0.0005 Å |
α | 94.308 ± 0.002° |
β | 96.002 ± 0.002° |
γ | 100.953 ± 0.002° |
Cell volume | 3004.32 ± 0.14 Å3 |
Cell temperature | 149 ± 2 K |
Ambient diffraction temperature | 149 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0494 |
Residual factor for significantly intense reflections | 0.0311 |
Weighted residual factors for significantly intense reflections | 0.065 |
Weighted residual factors for all reflections included in the refinement | 0.0705 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.002 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4342150.html
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