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Information card for entry 4342401
Preview
| Coordinates | 4342401.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Sm@C2v(9)-C82/NiOEP/0.87(bz)0.13(CF) |
|---|---|
| Formula | C123.3 H49.3 Cl0.42 N4 Ni Sm |
| Calculated formula | C123.473 H49.472 Cl0.396 N4 Ni Sm1.002 |
| Title of publication | Popular C82 Fullerene Cage Encapsulating a Divalent Metal Ion Sm(2+): Structure and Electrochemistry. |
| Authors of publication | Hu, Ziqi; Hao, Yajuan; Slanina, Zdeněk; Gu, Zhenggen; Shi, Zujin; Uhlík, Filip; Zhao, Yunfeng; Feng, Lai |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2015 |
| Journal volume | 54 |
| Journal issue | 5 |
| Pages of publication | 2103 |
| a | 25.328 ± 0.0018 Å |
| b | 15.1696 ± 0.0011 Å |
| c | 19.7982 ± 0.0014 Å |
| α | 90° |
| β | 95.052 ± 0.001° |
| γ | 90° |
| Cell volume | 7577.2 ± 0.9 Å3 |
| Cell temperature | 90 ± 2 K |
| Ambient diffraction temperature | 90 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.1278 |
| Residual factor for significantly intense reflections | 0.1177 |
| Weighted residual factors for significantly intense reflections | 0.3804 |
| Weighted residual factors for all reflections included in the refinement | 0.3966 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.909 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4342401.html
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Users of the data should acknowledge the original authors of the
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