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Information card for entry 4342789
Preview
Coordinates | 4342789.cif |
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Original paper (by DOI) | HTML |
Formula | C22 H34 N4 Ni O S2 |
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Calculated formula | C22 H34 N4 Ni O S2 |
SMILES | [Ni]12(SCCN1C(=O)c1[n]2cccc1)Sc1ccccc1N.[N+](CC)(CC)(CC)CC |
Title of publication | Accessing Ni(III)-Thiolate Versus Ni(II)-Thiyl Bonding in a Family of Ni-N2S2 Synthetic Models of NiSOD. |
Authors of publication | Broering, Ellen P.; Dillon, Stephanie; Gale, Eric M.; Steiner, Ramsey A.; Telser, Joshua; Brunold, Thomas C.; Harrop, Todd C. |
Journal of publication | Inorganic chemistry |
Year of publication | 2015 |
Journal volume | 54 |
Journal issue | 8 |
Pages of publication | 3815 - 3828 |
a | 11.5155 ± 0.0019 Å |
b | 10.0686 ± 0.0016 Å |
c | 20.095 ± 0.003 Å |
α | 90° |
β | 92.038 ± 0.002° |
γ | 90° |
Cell volume | 2328.4 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0583 |
Residual factor for significantly intense reflections | 0.0378 |
Weighted residual factors for significantly intense reflections | 0.0873 |
Weighted residual factors for all reflections included in the refinement | 0.0968 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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