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Information card for entry 4345906
Preview
| Coordinates | 4345906.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H28 Ge N2 S2 Te |
|---|---|
| Calculated formula | C12 H28 Ge N2 S2 Te |
| SMILES | [Ge]12(=[Te])(SC(C[N]1(C)C)(C)C)SC(C[N]2(C)C)(C)C |
| Title of publication | Germanium Compounds Containing Ge═E Double Bonds (E = S, Se, Te) as Single-Source Precursors for Germanium Chalcogenide Materials. |
| Authors of publication | Kim, Hyo-Suk; Jung, Eun Ae; Han, Seong Ho; Han, Jeong Hwan; Park, Bo Keun; Kim, Chang Gyoun; Chung, Taek-Mo |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2017 |
| Journal volume | 56 |
| Journal issue | 7 |
| Pages of publication | 4084 - 4092 |
| a | 7.8901 ± 0.0013 Å |
| b | 19.614 ± 0.003 Å |
| c | 12.585 ± 0.0018 Å |
| α | 90° |
| β | 106.798 ± 0.006° |
| γ | 90° |
| Cell volume | 1864.5 ± 0.5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0729 |
| Residual factor for significantly intense reflections | 0.0444 |
| Weighted residual factors for significantly intense reflections | 0.0958 |
| Weighted residual factors for all reflections included in the refinement | 0.1067 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.004 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4345906.html
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