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Information card for entry 4345907
Preview
| Coordinates | 4345907.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H28 Ge N2 S2 Se |
|---|---|
| Calculated formula | C12 H28 Ge N2 S2 Se |
| SMILES | [Se]=[Ge]12(SC(C[N]1(C)C)(C)C)SC(C[N]2(C)C)(C)C |
| Title of publication | Germanium Compounds Containing Ge═E Double Bonds (E = S, Se, Te) as Single-Source Precursors for Germanium Chalcogenide Materials. |
| Authors of publication | Kim, Hyo-Suk; Jung, Eun Ae; Han, Seong Ho; Han, Jeong Hwan; Park, Bo Keun; Kim, Chang Gyoun; Chung, Taek-Mo |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2017 |
| Journal volume | 56 |
| Journal issue | 7 |
| Pages of publication | 4084 - 4092 |
| a | 7.8523 ± 0.0003 Å |
| b | 19.313 ± 0.0006 Å |
| c | 12.2445 ± 0.0004 Å |
| α | 90° |
| β | 106.469 ± 0.002° |
| γ | 90° |
| Cell volume | 1780.71 ± 0.11 Å3 |
| Cell temperature | 296 ± 1 K |
| Ambient diffraction temperature | 296 ± 1 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0237 |
| Residual factor for significantly intense reflections | 0.0193 |
| Weighted residual factors for significantly intense reflections | 0.049 |
| Weighted residual factors for all reflections included in the refinement | 0.0507 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4345907.html
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