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Information card for entry 4507440
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Jmol._Canvas2D (Jmol) "jmolApplet0"[x]
Coordinates | 4507440.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 29DPhDNTT |
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Chemical name | 29DPhDNTT |
Formula | C34 H20 S2 |
Calculated formula | C34 H20 S2 |
SMILES | c12cc3cc(c4ccccc4)ccc3cc2c2c(s1)c1c(cc3cc(ccc3c1)c1ccccc1)s2 |
Title of publication | Diphenyl Derivatives of Dinaphtho[2,3-b:2',3'-f]thieno[3,2-b]thiophene: Organic Semiconductors for Thermally Stable Thin-Film Transistors. |
Authors of publication | Kang, Myeong Jin; Miyazaki, Eigo; Osaka, Itaru; Takimiya, Kazuo; Nakao, Akiko |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2013 |
Journal volume | 5 |
Journal issue | 7 |
Pages of publication | 2331 - 2336 |
a | 24.32 ± 0.007 Å |
b | 7.613 ± 0.002 Å |
c | 6.1826 ± 0.0018 Å |
α | 90° |
β | 94.301 ± 0.004° |
γ | 90° |
Cell volume | 1141.5 ± 0.6 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0642 |
Residual factor for significantly intense reflections | 0.054 |
Weighted residual factors for significantly intense reflections | 0.1615 |
Weighted residual factors for all reflections included in the refinement | 0.1679 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.25 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4507440.html
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Users of the data should acknowledge the original authors of the
structural data.