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Information card for entry 4507441
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Jmol._Canvas2D (Jmol) "jmolApplet0"[x]
Coordinates | 4507441.cif |
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Original paper (by DOI) | HTML |
Common name | 3,10-DPhDNTT |
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Chemical name | 3,10-DPhDNTT |
Formula | C34 H20 S2 |
Calculated formula | C34 H20 S2 |
SMILES | c12c(c3c(c4c(s3)cc3c(c4)cc(cc3)c3ccccc3)s1)Cc1cc(ccc1C2)c1ccccc1 |
Title of publication | Diphenyl Derivatives of Dinaphtho[2,3-b:2',3'-f]thieno[3,2-b]thiophene: Organic Semiconductors for Thermally Stable Thin-Film Transistors. |
Authors of publication | Kang, Myeong Jin; Miyazaki, Eigo; Osaka, Itaru; Takimiya, Kazuo; Nakao, Akiko |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2013 |
Journal volume | 5 |
Journal issue | 7 |
Pages of publication | 2331 - 2336 |
a | 6.9888 ± 0.0003 Å |
b | 46.665 ± 0.009 Å |
c | 7.18 ± 0.0004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2341.6 ± 0.5 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 3 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0698 |
Residual factor for significantly intense reflections | 0.0594 |
Weighted residual factors for significantly intense reflections | 0.1608 |
Weighted residual factors for all reflections included in the refinement | 0.1651 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.338 |
Diffraction radiation wavelength | 1 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4507441.html
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