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Information card for entry 4512672
Preview
Coordinates | 4512672.cif |
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Original paper (by DOI) | HTML |
Formula | C43 H33 N3 O2 Pd |
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Calculated formula | C43 H33 N3 O2 Pd |
SMILES | [Pd]12(c3c(c4[n]1cccc4)cccc3)[N](=Cc1c(O2)ccc(OC)c1)c1ccc(cc1)c1ccc(N(c2ccccc2)c2ccccc2)cc1 |
Title of publication | Electropolymerized highly photoconductive thin films of cyclopalladated and cycloplatinated complexes. |
Authors of publication | Ionescu, Andreea; Lento, Raffaella; Mastropietro, Teresa F.; Aiello, Iolinda; Termine, Roberto; Golemme, Attilio; Ghedini, Mauro; Bellec, Nathalie; Pini, Elena; Rimoldi, Isabella; Godbert, Nicolas |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2015 |
Journal volume | 7 |
Journal issue | 7 |
Pages of publication | 4019 - 4028 |
a | 10.0139 ± 0.0018 Å |
b | 10.033 ± 0.002 Å |
c | 35.752 ± 0.007 Å |
α | 91.858 ± 0.009° |
β | 95.719 ± 0.009° |
γ | 108.279 ± 0.009° |
Cell volume | 3386 ± 1.1 Å3 |
Cell temperature | 273 ± 2 K |
Ambient diffraction temperature | 273 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0872 |
Residual factor for significantly intense reflections | 0.0499 |
Weighted residual factors for significantly intense reflections | 0.1066 |
Weighted residual factors for all reflections included in the refinement | 0.1254 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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