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Information card for entry 4512673
Preview
Coordinates | 4512673.cif |
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Original paper (by DOI) | HTML |
Formula | C45 H35 N3 O2 Pd |
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Calculated formula | C45 H35 N3 O2 Pd |
Title of publication | Electropolymerized highly photoconductive thin films of cyclopalladated and cycloplatinated complexes. |
Authors of publication | Ionescu, Andreea; Lento, Raffaella; Mastropietro, Teresa F.; Aiello, Iolinda; Termine, Roberto; Golemme, Attilio; Ghedini, Mauro; Bellec, Nathalie; Pini, Elena; Rimoldi, Isabella; Godbert, Nicolas |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2015 |
Journal volume | 7 |
Journal issue | 7 |
Pages of publication | 4019 - 4028 |
a | 6.5511 ± 0.0019 Å |
b | 9.456 ± 0.003 Å |
c | 31.81 ± 0.009 Å |
α | 93.023 ± 0.014° |
β | 92.432 ± 0.014° |
γ | 106.44 ± 0.013° |
Cell volume | 1884 ± 1 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1622 |
Residual factor for significantly intense reflections | 0.1111 |
Weighted residual factors for significantly intense reflections | 0.2813 |
Weighted residual factors for all reflections included in the refinement | 0.3191 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.103 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/4512673.html
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