Information card for entry 4514455
| Formula |
C18 H14 N2 S4 |
| Calculated formula |
C18 H14 N2 S4 |
| SMILES |
c12c3c(c4c(n3CC)ccs4)sc1c1c(c3c(n1CC)ccs3)s2 |
| Title of publication |
Influences of Structural Modification of S, N-Hexacenes on the Morphology and OFET Characteristics. |
| Authors of publication |
Huang, Yi-Fan; Wang, Chun-Kai; Lai, Bo-Han; Chung, Chin-Lung; Chen, Chin-Yi; Ciou, Guan-Ting; Wong, Ken-Tsung; Wang, Chien-Lung |
| Journal of publication |
ACS applied materials & interfaces |
| Year of publication |
2019 |
| Journal volume |
11 |
| Journal issue |
24 |
| Pages of publication |
21756 - 21765 |
| a |
8.5058 ± 0.0002 Å |
| b |
13.0542 ± 0.0003 Å |
| c |
7.9663 ± 0.0002 Å |
| α |
90° |
| β |
104.207 ± 0.003° |
| γ |
90° |
| Cell volume |
857.5 ± 0.04 Å3 |
| Cell temperature |
295 ± 2 K |
| Ambient diffraction temperature |
295 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0398 |
| Residual factor for significantly intense reflections |
0.0365 |
| Weighted residual factors for significantly intense reflections |
0.0968 |
| Weighted residual factors for all reflections included in the refinement |
0.1007 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.05 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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