Information card for entry 4514456
| Formula |
C30 H38 N2 S4 |
| Calculated formula |
C30 H38 N2 S4 |
| SMILES |
s1c2c(c3n(c4c(c13)scc4)C[C@H](CC)CCCC)sc1c2n(c2c1scc2)C[C@@H](CC)CCCC |
| Title of publication |
Influences of Structural Modification of S, N-Hexacenes on the Morphology and OFET Characteristics. |
| Authors of publication |
Huang, Yi-Fan; Wang, Chun-Kai; Lai, Bo-Han; Chung, Chin-Lung; Chen, Chin-Yi; Ciou, Guan-Ting; Wong, Ken-Tsung; Wang, Chien-Lung |
| Journal of publication |
ACS applied materials & interfaces |
| Year of publication |
2019 |
| Journal volume |
11 |
| Journal issue |
24 |
| Pages of publication |
21756 - 21765 |
| a |
14.263 ± 0.003 Å |
| b |
5.4465 ± 0.0011 Å |
| c |
19.286 ± 0.003 Å |
| α |
90° |
| β |
99.215 ± 0.014° |
| γ |
90° |
| Cell volume |
1478.9 ± 0.5 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.1518 |
| Residual factor for significantly intense reflections |
0.1128 |
| Weighted residual factors for significantly intense reflections |
0.2911 |
| Weighted residual factors for all reflections included in the refinement |
0.3379 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.116 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/4514456.html