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Information card for entry 4515150
Preview
| Coordinates | 4515150.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H20 Cu N6 O2 |
|---|---|
| Calculated formula | C24 H20 Cu N6 O2 |
| SMILES | [Cu]12([N](=NN(O1)c1ccccc1)c1ccccc1)ON(N=[N]2c1ccccc1)c1ccccc1 |
| Title of publication | Supramolecular Similarity in Polymorphs: Use of Similarity Indices (I<sup>X</sup>). |
| Authors of publication | Salbego, Paulo R. S.; Bender, Caroline R.; Orlando, Tainára; Moraes, Guilherme A.; Copetti, João P P; Weimer, Gustavo H.; Bonacorso, Helio G.; Zanatta, Nilo; Hoerner, Manfredo; Martins, Marcos A. P. |
| Journal of publication | ACS omega |
| Year of publication | 2019 |
| Journal volume | 4 |
| Journal issue | 6 |
| Pages of publication | 9697 - 9709 |
| a | 6.95 ± 0.008 Å |
| b | 12.601 ± 0.01 Å |
| c | 13.48 ± 0.013 Å |
| α | 69.33 ± 0.03° |
| β | 83.01 ± 0.04° |
| γ | 83.13 ± 0.06° |
| Cell volume | 1092.6 ± 1.9 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0417 |
| Residual factor for significantly intense reflections | 0.0303 |
| Weighted residual factors for significantly intense reflections | 0.0824 |
| Weighted residual factors for all reflections included in the refinement | 0.0941 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.15 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.56087 Å |
| Diffraction radiation type | AgKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4515150.html
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Users of the data should acknowledge the original authors of the
structural data.